The main research works of this dissertation can be summarized as follows : ( 1 ) A new method for analog circuit test nodes optimal selection which is based on inner-and inter-class sensitivity factor and fault isolation degree is proposed. 论文主要研究工作包括:(1)设计了一种基于类内类间敏感度因子与故障隔离度的模拟电路测试节点优选方法。
New Parallel Processing Method for Circuit Test Generation 电路测试生成的一种并行处理方法
A new synthetic test circuit for the operational test of HVDC thyristor modules 用于HVDC晶闸管模块运行试验的新合成试验回路
A new rhodium plating process applicable to printed circuit board was optimized by orthogonal test. 通过正交试验优选出一种用于印刷电路板的镀铑新工艺。
A new circuit model was designed and analyzed according to the basic principles of dynamic strain test. 针对动态应变测试的基本原理,对电路的总体框架进行了分析设计。