Flicker noise ( 1 / f noise ) in Optoelectronic Coupled Devices ( OCDs ) is studied over a wide range of bias currents with special emphasis on the influence of electrical stress. 对电应力(ES)前后光电耦合器件的闪烁噪声(1/f噪声)进行了实验和理论研究。
And the detection circuit and control circuit in the subsystems of the electrical stress system are also designed. 在电应力(ES)分系统中,对检测电路和控制电路进行了设计。
Common source inductance obtained mainly affects switching losses and electrical stress is affected by the drain inductance. 得出共源极寄生电感主要影响开关损耗,漏极电感主要影响电应力(ES)的结论,从而为有源封装技术可以提高变换器电气性能提供了理论依据。
The charge trapping effect of Al / SRO / Si MOS devices under lateral electrical stress is investigated. 利用Al/SRO/SiMOS,对富硅二氧化硅(SRO)材料在横向电压作用下的电荷俘获效应进行了研究。
The determination of the environment parameter such as temperature stress, vibration stress, electrical stress and humidity in both environments on the ground and in air was analyzed, and the related rule or computation formulas were also given. 研究了地面和空中两种试验环境中温度应力、振动应力、电应力(ES)和湿度等环境参数的确定,并给出了相应的原则或计算公式。