A new technological marvel was invented at Cambridge University in England, the scanning electron microscope. 一项科技新奇迹在英国剑桥大学诞生了——这就是扫描电子显微镜(EM)。
The electron microscope uses a beam of electrons to produce images at high magnifications 电子显微镜(EM)利用电子束形成高倍影像。
The scanning electron microscope provides information on chemical composition by use of X-ray spectrometer attachments. 扫描电子显微镜(EM)能利用x射线谱仪的附件来提供化学组分的信息。
Methods Transmission electron microscope and immunohistochemistry were used. 方法采用透射电镜和免疫组化法。
This paper introduces the new development of the detector used in scanning electron microscope ( SEM ). 介绍了扫描电子显微镜(EM)(SEM)信号探头研究的最新成果。