In 1971, large scale integration ( LSI ) was used to put thousands of gates on a chip. 1971年,在一块芯片上集成了上千个组件的大规模集成(LSI)电路(lsi)问世。
In this dissertation, the VLSI ( very large scale integration ) test method based on IDDT ( transient current ) information, a new hot spot of test strategies, is researched. 本文对作为新的研究热点的测试方法&基于动态电流测试信息的VLSI测试方法进行了研究。
Investigates the implementation scheme of cellular automata ( CA ) for application in the pseudo-random test of very large scale integration ( VLSI ) as a test pattern generator. 研究细胞自动机(CA)在超大规模集成(LSI)电路(VLSI)伪随机测试中作为测试激励的结构和实现方法。
Computers were getting smaller and more powerful due to the development of integrated circuits ( ICs ) and large scale integration ( LSI ). 由于集成电路(ICs)和大规模集成(LSI)(LSI)的开发,计算机变得越来越小、越来越强大。
Silicon on sapphire large scale integration 蓝宝石上硅大规模集成(LSI)电路