Based on the measurement method on optical film refractive index and thickness, commonly used in the world, a method which derived from variable angle spectroscopic ellipsometry is used to set the primary standard of optical film refractive index and thickness for national defense. 论文在综合了国际上光学薄膜折射率和厚度不同测试方法的基础上,采用可变角椭圆偏振法来实现和建立国防系统的光学薄膜折射率和厚度最高标准。